GATE Exam 2019 Syllabus For Electronics And Communication Engineering

GATE Exam 2019 Syllabus For Electronics And Communication Engineering


gate exam 2019


The GATE Exam is one of the most prestigious exams in the country. A perfect opportunity to not just pursue higher studies from some of India’s top colleges but to also get a job with one of the PSUs; GATE exam has it all. As such, it is no wonder that so many people are looking at the GATE exam 2019 with dewy eyes.

In continuation to our GATE 2019 syllabus series, today we will be looking into and discussing about the GATE syllabus for ECE. And, not just the syllabus, in this article we will also introduce you to the type of questions you can expect during the exam, best GATE exam 2019 preparation books and a brief GATE exam preparation guide.



GATE Exam syllabus – General Aptitude

The General Aptitude section of the GATE exam holds a 15% weight and is as such an important part of the GATE exam 2019. Though not particularly tough, the General Aptitude section is known to be tricky.

Furthermore, this section is divided into two parts – Verbal Ability and Numeric Ability.

Verbal Ability

  • Verbal Analogies
  • Verbal Deduction
  • Sentence Completion
  • English Grammar
  • Critical Reasoning
  • Word Groups
  • Instructions

Numeric Ability

  • Data Interpretation
  • Numeric Reasoning
  • Numeric Estimation
  • Numeric Computation



GATE exam syllabus for ECE

The GATE exam 2019 syllabus is designed to test your skills and proficiency in the subject. Unless and until you have really spent time understanding the mechanics of things, you will find it hard to score well.

Also, with the GATE exam, the Engineering Mathematics section is common for most of the modules. However, the topics covered under it may vary from subject to subject.

Engineering Mathematics – Linear Algebra, Calculus, Vector Analysis, Complex Analysis, Differential Equations, Probability, Statistics, Numerical Methods.

Networks, Signals and Systems – Continuous-time Signals, Network Solution Methods.

Electronic Devices – Energy bands in intrinsic and extrinsic silicon; Carrier transport; diffusion current, drift current, mobility and resistivity; Generation and recombination of carriers; Poisson and continuity equations; P-N junction, Zener diode, BJT, MOS capacitor, MOSFET, LED, photodiode and solar cell; Integrated circuit fabrication process; oxidation, diffusion, ion implantation, photolithography and twin-tub CMOS process.

Analog Circuits – Small signal equivalent circuits of diodes, BJTs and MOSFETs; Simple diode circuits: clipping, clamping and rectifiers; Single-stage BJT and MOSFET amplifiers: biasing, bias stability, mid-frequency small signal analysis and frequency response; BJT and MOSFET amplifiers: multi-stage, differential, feedback, power and operational; Simple op-amp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, single-transistor and op- amp configurations; Function generators, wave-shaping circuits and 555 timers; Voltage reference circuits; Power supplies: ripple removal and regulation.

Digital Circuits – Number systems; Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters, multiplexers, decoders and PLAs; Sequential circuits: latches and flip‐flops, counters, shift‐registers and finite state machines; Data converters: sample and hold circuits, ADCs and DACs; Semiconductor memories: ROM, SRAM, DRAM; 8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing.

Control Systems – Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph; Transient and steady-state analysis of LTI systems; Frequency response; Routh-Hurwitz and Nyquist stability criteria; Bode and root-locus plots; Lag, lead and lag-lead compensation; State variable model and solution of state equation of LTI systems.

Communications – Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI systems; Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM, superheterodyne receivers, circuits for analog communications; Information theory: entropy, mutual information and channel capacity theorem; Digital communications: PCM, DPCM, digital modulation schemes, amplitude, phase and frequency shift keying (ASK, PSK, FSK), QAM, MAP and ML decoding, matched filter receiver, calculation of bandwidth, SNR and BER for digital modulation; Fundamentals of error correction, Hamming codes; Timing and frequency synchronization, inter-symbol interference and its mitigation; Basics of TDMA, FDMA and CDMA.

Electromagnetics – Electrostatics; Maxwell’s equations: differential and integral forms and their interpretation, boundary conditions, wave equation, Poynting vector; Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through various media, skin depth; Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, S-parameters, Smith chart; Waveguides: modes, boundary conditions, cut-off frequencies, dispersion relations; Antennas: antenna types, radiation pattern, gain and directivity, return loss, antenna arrays; Basics of radar; Light propagation in optical fibres.

Sample questions 

Q. A binary source generates symbols X∈{-1,1} which are transmitted over a noisy channel. The probability of transmitting X = 1 is 0.5. Input to the threshold detector is R = X + N. The probability density function fN(n) of the noise N is shown below.



If the detection threshold is zero, then the probability of error (correct to two decimal places) is____.



Q. The points P, Q, and R shown on the Smith chart (normalized impedance chart) in the following figure represent:

(A) P: Open Circuit, Q: Short Circuit, R: Matched Load
(B) P: Open Circuit, Q: Matched Load, R: Short Circuit
(C) P: Short Circuit, Q: Matched Load, R: Open Circuit
(D) P: Short Circuit, Q: Open Circuit, R: Matched Load


Q. Let M be a real 4 × 4 matrix. Consider the following statements:
S1: M has 4 linearly independent eigenvectors
S2: M has 4 distinct eigenvalues.
S3: M is non-singular (invertible)

Which one among the following is TRUE?

(A) S1 implies S2

(B) S1 implies S3

(C) S2 implies S1

(D) S3 implies S2


Recommended books

– GATE ECE by R.K. Kanodia

Modern Digital and Analog Communications Systems by B.P Lathi

Quantitative Aptitude by R.S Agarwal

Semiconductor Physics and Devices by Donald A. Neamen

Principles of Electromagnetics by Matthew N. O. Sadiku

Network Analysis by Mac Van Valkenburg

Engineering Circuit Analysis by William H. Hayt

Microelectronic Circuits: Theory and Applications by Adel S. Sedra, Kenneth Carless Smith

Digital Design by M. Morris Mano

Modern Digital Electronics by R. P Jain

Antenna Theory by Balanis

NPTEL Lectures by Prof. R. Shevgaonkar



How to best prepare for GATE Exam 2019

Before you start with your GATE exam preparation, you should get a thorough understanding of the syllabus, see which topics you might face the most issue with and which most and then divide it accordingly. Now –

Work on a timetable

We cannot stress enough how important a good GATE Exam timetable can be. A thorough exam timetable can help you keep track of your improvements and progress. It will also remind you when you are not doing enough to prepare well for the GATE exam 2019.

Your timetable should be more like an exam plan of how you will proceed along the syllabus, which topics you will cover first and in how much time. Also, specific time should be laid out for revisions to fortify your GATE preparation.


Attempt sample papers

If you truly want to succeed at the GATE exam 2019, then you will have to make sample papers a part of your daily or at-the-least, weekly curriculum. Sample papers can help you remember the concepts better and see how they can be applied to work out a solution.

So, the more sample papers you solve, the more it will help you with your GATE exam preparation. You can easily find free sample papers online or buy books especially tending to this topic.


Solve Mock GATE tests

Mock GATE tests can be a brilliant way to help you on with your GATE exam preparation. GATE mock tests, like the AM-GATE mock test, can really aid you and provide you with insightful tips on how to prepare better for the GATE exam.

Not just that, with AM-GATE you stand a chance of competing with other GATE aspirants to see where you stand.

However, while you might be eager to test yourself, you should ideally take the test in the month of January to access your preparation best.

If you frame your timetable right and stick by it, then you should ideally be done with your first GATE exam 2019 revision by the first week of January. Taking a test around this time will help you put your best foot forward to be able to access how ready you are.

Also, by the time the Mock Gate test results will be out, you will have ample time to learn from your mistakes and rectify them before you face the GATE exam.



The GATE exam 2019 can be a career-defining opportunity for you, so don’t leave any stone unturned in making your attempt count. Register for AM-GATE Mock Test today!